standards english version

NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA

GB/T 4058-2009

Test method for detection of oxidation induced defects in polished silicon wafers

Issued Date:

Implemented Date:

Issued by:

The Standardization Administration of the People's Republic of China

Thanks for your interest in "GB/T 4058-2009" standard !
This GB standard english version is not ready translated, only after get your order, then we translate it, time usually need more 3-5 days .

GB Standard Code	GB/T 4058-2009
Standard Category	China National Standards
GB Standard English Title	Test method for detection of oxidation induced defects in polished silicon wafers
GB Standard Chinese Title	硅抛光片氧化诱生缺陷的检验方法
Chinese Version Price	$2 USD per 1pages
English Translation Fee	About $15~$30 per 1 page (1,000 words)
Sale Price (30~50% off)	Inquire us for detail price


* Order Items
* Payment Amount	USD
* Email

Relevant GB standards about " GB/T 4058-2009 Test method for dete" >>>

Find out: 53107 Items | To Page of: [First] - [Previous] - [Next] - [Last] | [28958] [28959] [28960] [28961] [28962] [28963] [28964]